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回收E6607C 无线测试仪

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品 牌: E6607C 
单 价: 面议 
起 订:  
供货总量:
发货期限: 自买家付款之日起 3 天内发货
所在地: 广东 东莞市
有效期至: 长期有效
最后更新: 2021-08-05 18:43
浏览次数: 39
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产品详细说明
E6607C【肖晓:13377777186】 EXT Multiport Wireless Communications Test Set

回收安捷伦E6607C_二手E6607C_收购二手E6607C

客服QQ:2090529353
地址:东莞市塘厦镇花园中心

回收闲置仪器-没有十全十美的产品,有百分之百的服务

全程优质服务,欢迎来电13377777186咨询!

主要特性与技术指标
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing
 
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